Apparatus and method for measuring bending of an object, by using an optical waveguide
Patent number: 9417143
Abstract: An apparatus and method for measuring bending of an object, a position of an item touching the object, and a shearing force of the item using an optical waveguide may include a frequency measurer to measure a frequency of light reflected from a grating of an optical waveguide, and a bending measurer to determine bending of an object to which the optical waveguide is attached using the frequency.
Type: Grant
Filed: March 6, 2014
Date of Patent: August 16, 2016
Assignee: Samsung Electronics Co., Ltd.
Inventors: Soo Chul Lim, Joon Ah Park, Hyun Jeong Lee, Seung Ju Han, Kyung Won Moon